Intrafraction Verification of Gated RapidArc by Using...

International Journal of Radiation Oncology*Biology*Physics 2012 Vol. 83; Iss. 5

Intrafraction Verification of Gated RapidArc by Using Beam-Level Kilovoltage X-Ray Images

Ruijiang Li, Edward Mok, Daniel T. Chang, Megan Daly, Billy W. Loo Jr., Maximilian Diehn, Quynh-Thu Le, Albert Koong, Lei Xing
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Volume:
83
Year:
2012
Language:
english
DOI:
10.1016/j.ijrobp.2012.03.006
File:
PDF, 797 KB
english, 2012
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