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A site-specific focused-ion-beam lift-out method for cryo Transmission Electron Microscopy
Stefano Rubino, Sultan Akhtar, Petter Melin, Andrew Searle, Paul Spellward, Klaus LeiferVolume:
180
Year:
2012
Language:
english
DOI:
10.1016/j.jsb.2012.08.012
File:
PDF, 1.30 MB
english, 2012