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A cortical potential imaging study from simultaneous extra- and intracranial electrical recordings by means of the finite element method
Yingchun Zhang, Lei Ding, Wim van Drongelen, Kurt Hecox, David M. Frim, Bin HeVolume:
31
Year:
2006
Language:
english
DOI:
10.1016/j.neuroimage.2006.02.027
File:
PDF, 750 KB
english, 2006