SENSE factors for reliable cortical thickness measurement

NeuroImage 2008 Vol. 40; Iss. 1

SENSE factors for reliable cortical thickness measurement

Hae-Jeong Park, Tak Youn, Seok-Oh Jeong, Maeng-Keun Oh, Sei-Young Kim, Eung-Yeop Kim
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Volume:
40
Year:
2008
Language:
english
DOI:
10.1016/j.neuroimage.2007.11.013
File:
PDF, 2.49 MB
english, 2008
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