![](/img/cover-not-exists.png)
Amorphous structure and electrical performance of low-temperature annealed amorphous indium zinc oxide transparent thin film transistors
Sunghwan Lee, Brian Bierig, David C. PaineVolume:
520
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2011.06.082
File:
PDF, 744 KB
english, 2012