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Performance of organic field effect transistors with high-k gate oxide after application of consecutive bias stress
Sunwoo Lee, Changhwan Choi, Kilbock Lee, Joong Hwee Cho, Ki-Young Ko, Jinho AhnVolume:
521
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2012.03.078
File:
PDF, 692 KB
english, 2012