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The microstructure and optical properties of p-type microcrystalline silicon thin films characterized by ex-situ spectroscopic ellipsometry
He Zhang, Xiaodan Zhang, Guofu Hou, Changchun Wei, Jian Sun, Xinhua Geng, Shaozhen Xiong, Ying ZhaoVolume:
521
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2012.03.081
File:
PDF, 831 KB
english, 2012