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Thickness dependent residual stress in sputtered AlN thin...

Thickness dependent residual stress in sputtered AlN thin films

Paulius Pobedinskas, Jean-Christophe Bolsée, Wim Dexters, Bart Ruttens, Vincent Mortet, Jan D'Haen, Jean V. Manca, Ken Haenen
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Volume:
522
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2012.08.015
File:
PDF, 872 KB
english, 2012
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