Surface plasmon resonance investigation procedure as a structure sensitive method for SnO2 nanofilms
V.S. Grinevich, L.M. Filevska, I.E. Matyash, L.S. Maximenko, O.N. Mischuk, S.P. Rudenko, B.K. Serdega, V.A. Smyntyna, B. UlugVolume:
522
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2012.08.054
File:
PDF, 564 KB
english, 2012