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Electrical characterization and conduction mechanism of impurity-doped BaSi2 films grown on Si(111) by molecular beam epitaxy
M. Ajmal Khan, T. Saito, K. Nakamura, M. Baba, W. Du, K. Toh, K. Toko, T. SuemasuVolume:
522
Year:
2012
Language:
english
DOI:
10.1016/j.tsf.2012.09.005
File:
PDF, 584 KB
english, 2012