Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series
Kimoto, Koji, Kurashima, Keiji, Nagai, Takuro, Ohwada, Megumi, Ishizuka, KazuoVolume:
121
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.06.012
Date:
October, 2012
File:
PDF, 1.05 MB
english, 2012