A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
Zhukov, Alex, Richards, Owen, Ostanin, Victor, Korchev, Yuri, Klenerman, DavidVolume:
121
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.06.015
Date:
October, 2012
File:
PDF, 1.16 MB
english, 2012