Quantifying the low-energy limit and spectral resolution in...

Ultramicroscopy 2013 / 1 Vol. 124

Quantifying the low-energy limit and spectral resolution in valence electron energy loss spectroscopy

Aguiar, Jeffery A., Reed, Bryan W., Ramasse, Quentin M., Erni, Rolf, Browning, Nigel D.
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Volume:
124
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.08.010
Date:
January, 2013
File:
PDF, 839 KB
english, 2013
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