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Application of diffuse reflectance near-infrared spectroscopy for determination of crystallinity
Jeffery J. Seyer, Paul E. Luner, Mark S. KemperVolume:
89
Year:
2000
Language:
english
Pages:
12
DOI:
10.1002/1520-6017(200010)89:103.0.co;2-q
File:
PDF, 269 KB
english, 2000