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P.2.a.007 Quantifying rater drift on the HAM-D: implications for reliability, sample size, and ongoing training strategy
A. DeFries, B. Rothman, C. Yavorsky, M. Opler, J. Gordon, K. Tourian, B. Pitrosky, C. VialetVolume:
21
Year:
2011
Language:
english
DOI:
10.1016/s0924-977x(11)70571-5
File:
PDF, 71 KB
english, 2011