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Characterization of internal damage in a MMCp using X-ray synchrotron phase contrast microtomography
J.-Y Buffière, E Maire, P Cloetens, G Lormand, R FougèresVolume:
47
Year:
1999
Language:
english
DOI:
10.1016/s1359-6454(99)00024-5
File:
PDF, 619 KB
english, 1999