X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates
Budai, John D., Yang, Wenge, Tamura, Nobumichi, Chung, Jin-Seok, Tischler, Jonathan Z., Larson, Bennett C., Ice, Gene E., Park, Chan, Norton, David P.Volume:
2
Language:
english
Journal:
Nature Materials
DOI:
10.1038/nmat916
Date:
July, 2003
File:
PDF, 724 KB
english, 2003