Microimaging at 14 Tesla Using GESEPI for Removal of...

Microimaging at 14 Tesla Using GESEPI for Removal of Magnetic Susceptibility Artifacts in T2*-Weighted Image Contrast

Qing X. Yang, Michael B. Smith, Richard W. Briggs, Robert E. Rycyna
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Volume:
141
Year:
1999
Language:
english
Pages:
6
DOI:
10.1006/jmre.1999.1900
File:
PDF, 168 KB
english, 1999
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