Imaging of Electrically Detected Magnetic Resonance of a...

Journal of Magnetic Resonance 2001 Vol. 153; Iss. 1

Imaging of Electrically Detected Magnetic Resonance of a Silicon Wafer

Toshiyuki Sato, Hidekatsu Yokoyama, Hiroaki Ohya, Hitoshi Kamada
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Volume:
153
Year:
2001
Language:
english
Pages:
4
DOI:
10.1006/jmre.2001.2427
File:
PDF, 132 KB
english, 2001
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