Implications of clock distribution faults and issues with...

IEEE Transactions on Computers 2004 Vol. 53; Iss. 5

Implications of clock distribution faults and issues with screening them during manufacturing testing

Metra, C., Di Francescantonio, S., Mak, T.M.
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Volume:
53
Year:
2004
Language:
english
DOI:
10.1109/tc.2004.1275295
File:
PDF, 2.38 MB
english, 2004
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