A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
Melstrand, O., O'Neill, E., Sobelman, G.E., Dokos, D.Volume:
3
Year:
1984
Language:
english
DOI:
10.1109/tcad.1984.1270056
File:
PDF, 708 KB
english, 1984