Scanning electron microscopy and transmission electron...

Journal of Microscopy 2006 Vol. 223; Iss. 3

Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals

H. PAUL, J. H. DRIVER, J. MORGIEL, A. LENS, A. BYDAŁEK, M. BIJAK
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
223
Year:
2006
Language:
english
DOI:
10.1111/j.1365-2818.2006.01641.x
File:
PDF, 128 KB
english, 2006
Conversion to is in progress
Conversion to is failed