Manufacturers' corner - Design and performance of the CM20 FEG field emission TEM
Otten, Max T., Mul, Peter M., de Jong, Marc J. C.Volume:
3
Year:
1992
Language:
english
Journal:
Microscopy Microanalysis Microstructures
DOI:
10.1051/mmm:019920030108300
File:
PDF, 1.60 MB
english, 1992