[MTT005 MTT-S International Microwave Symposium Digest -...

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[MTT005 MTT-S International Microwave Symposium Digest - St. Louis, MO, USA (June 1985)] MTT-S International Microwave Symposium Digest - Dynamic Diode Mixer Damage Measurements

Garver, R.V., Fazi, C., Bruns, H.
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Volume:
85
Year:
1985
Language:
english
DOI:
10.1109/MWSYM.1985.1132031
File:
PDF, 112 KB
english, 1985
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