[IEEE 2012 IEEE Radiation Effects Data Workshop (in...

  • Main
  • [IEEE 2012 IEEE Radiation Effects Data...

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Total Ionizing Dose Radiation Test on the Temperature Sensor TMP36 from Analog Devices

Álvarez, Maite, Jiménez, Juan J., González-Guerrero, Miguel, Hernando, Carlos, Guerrero, Héctor
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/REDW.2012.6353709
File:
PDF, 4.29 MB
english, 2012
Conversion to is in progress
Conversion to is failed