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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Total Ionizing Dose Radiation Test on the Temperature Sensor TMP36 from Analog Devices
Álvarez, Maite, Jiménez, Juan J., González-Guerrero, Miguel, Hernando, Carlos, Guerrero, HéctorYear:
2012
Language:
english
DOI:
10.1109/REDW.2012.6353709
File:
PDF, 4.29 MB
english, 2012