Analytical models and algorithms for the efficient signal...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2004 Vol. 12; Iss. 4

Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects

Seongkyun Shin, Yungseon Eo, Eisenstadt, W.R., Jongin Shim
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Volume:
12
Year:
2004
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2004.825836
File:
PDF, 881 KB
english, 2004
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