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Micro-four-point-probe characterization of nanowires fabricated using the nanostencil technique
Lin, R, Bammerlin, M, Hansen, O, Schlittler, R R, Bøggild, PVolume:
15
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/15/9/042
Date:
September, 2004
File:
PDF, 213 KB
english, 2004