P-66: Accelerated Life Test (ALT) Evaluation Method for...

SID Symposium Digest of Technical Papers 2012 Vol. 43; Iss. 1

P-66: Accelerated Life Test (ALT) Evaluation Method for Backlight LEDs

I-Hsun Hsieh, Kun-Hung Hsieh, Chih-Kai Wang, Wei-Chih Ke, Hsin-Mien Wang
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Volume:
43
Year:
2012
Language:
english
DOI:
10.1002/j.2168-0159.2012.tb06042.x
File:
PDF, 309 KB
english, 2012
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