BIST/Digital-Compatible Testing of RF Devices Using...

Journal of Electronic Testing 2012 / 08 Vol. 28; Iss. 4

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting

Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Devarakond, Hyun Choi, Abhijit Chatterjee
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Volume:
28
Language:
english
DOI:
10.1007/s10836-012-5304-5
Date:
August, 2012
File:
PDF, 1.34 MB
english, 2012
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