A Novel TOPSIS-Based Test Vector Compaction Technique for...

Journal of Electronic Testing 2012 / 08 Vol. 28; Iss. 4

A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

Badar-ud-din Ahmed, Wang Youren, Rizwan Ullah, Najam-ud-din Ahmed
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Volume:
28
Language:
english
DOI:
10.1007/s10836-012-5311-6
Date:
August, 2012
File:
PDF, 236 KB
english, 2012
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