Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis
Vladimir Pasca, Lorena Anghel, Mounir BenabdenbiVolume:
28
Language:
english
DOI:
10.1007/s10836-012-5322-3
Date:
December, 2012
File:
PDF, 3.39 MB
english, 2012