Electron microscope study of dislocations introduced by...

Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873

Okuno, T., Saka, H.
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Volume:
48
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-012-6860-x
Date:
January, 2013
File:
PDF, 1.42 MB
english, 2013
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