Analysis of a method of measuring theS-parameters of...

Analysis of a method of measuring theS-parameters of microwave transistors

Yu. V. Ryasnyi, M. S. Chashkov, A. V. Borisov
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Volume:
55
Language:
english
DOI:
10.1007/s11018-012-0109-6
Date:
January, 2013
File:
PDF, 136 KB
english, 2013
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