Analyzing trap generation in silicon-nanocrystal memory...

Science China Technological Sciences 2012 / 03 Vol. 55; Iss. 3

Analyzing trap generation in silicon-nanocrystal memory devices using capacitance and current measurement

XiaoNan Yang, ManHong Zhang, Yong Wang, ZongLiang Huo, ShiBing Long, Bo Zhang, Jing Liu, Ming Liu
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Volume:
55
Language:
english
DOI:
10.1007/s11431-011-4694-4
Date:
March, 2012
File:
PDF, 651 KB
english, 2012
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