Study of latch-up immunization in bulk CMOS integrated...

Science China Technological Sciences 2012 / 11 Vol. 55; Iss. 11

Study of latch-up immunization in bulk CMOS integrated circuits exposed to transient ionizing radiation

RuiBin Li, Wei Chen, DongSheng Lin, ShanChao Yang, XiaoYan Bai, GuiZhen Wang, Yan Liu, Chao Qi, Qiang Ma
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Volume:
55
Language:
english
DOI:
10.1007/s11431-012-4895-5
Date:
November, 2012
File:
PDF, 706 KB
english, 2012
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