Effect of Isothermal Aging and Electromigration on the...

Effect of Isothermal Aging and Electromigration on the Microstructural Evolution of Solder Interconnections During Thermomechanical Loading

T. Laurila, J. Karppinen, V. Vuorinen, J. Li, A. Paul, M. Paulasto-Kröckel
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Volume:
41
Language:
english
DOI:
10.1007/s11664-012-2223-2
Date:
November, 2012
File:
PDF, 1.61 MB
english, 2012
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