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Evolution of the Structural and Electrical Properties of GeTe Under Different Annealing Conditions
Ki-Hong Kim, Yong-Koo Kyoung, Jun-Ho Lee, Yong-Nam Ham, Sang-Jun ChoiVolume:
42
Language:
english
DOI:
10.1007/s11664-012-2262-8
Date:
January, 2013
File:
PDF, 578 KB
english, 2013