Gate leakage current of NMOSFET with ultra-thin gate oxide

Journal of Central South University 2012 / 11 Vol. 19; Iss. 11

Gate leakage current of NMOSFET with ultra-thin gate oxide

Shi-gang Hu 胡仕刚, Xiao-Feng Wu 吴笑峰, Zai-fang Xi 席在芳
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Volume:
19
Language:
english
DOI:
10.1007/s11771-012-1385-7
Date:
November, 2012
File:
PDF, 519 KB
english, 2012
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