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Application of phase extension method to sub-Å transmission electron microscopy
Kim, Jin-Gyu, Lee, Sang-Gil, Yoo, Seung Jo, Shin, Jae Won, Lee, Seok-Hoon, Kim, Youn-JoongVolume:
18
Language:
english
Journal:
Metals and Materials International
DOI:
10.1007/s12540-012-5011-x
Date:
October, 2012
File:
PDF, 1.25 MB
english, 2012