The reliability of P50 suppression as measured by the...

The reliability of P50 suppression as measured by the conditioning/testing ratio is vastly improved by dipole modeling

Valerie A. Cardenas, Jack Gerson, George Fein
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Volume:
33
Year:
1993
Language:
english
DOI:
10.1016/0006-3223(93)90322-5
File:
PDF, 833 KB
english, 1993
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