A REM study of inhomogeneous stress fields induced by the interfacial steps at In0.2Ga0.8As/GaAs interface
Jian Jiang, Xiaochuan Zhou, Anyan Du, L.-M. Peng, Enge Wang, Shanming Mu, Zhantian ZhongVolume:
13
Year:
1993
DOI:
10.1006/spmi.1993.1074
File:
PDF, 252 KB
1993