Reflectance spectrophotometry extended to u.v. for...

Reflectance spectrophotometry extended to u.v. for terrestrial, lunar and meteoritic samples

Audouin Dollfus, André Cailleux, Bernard Cervelle, Chon Trung Hua, Jean-Claude Mandeville
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Volume:
44
Year:
1980
Language:
english
DOI:
10.1016/0016-7037(80)90090-3
File:
PDF, 1.25 MB
english, 1980
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