The effect of interface quality on Si  / ...

Superlattices and Microstructures 2001 Vol. 30; Iss. 4

The effect of interface quality on Si  /  SiO2resonant tunnel diodes

T. Sandu, R. Lake, W.P. Kirk
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Volume:
30
Year:
2001
Language:
english
Pages:
4
DOI:
10.1006/spmi.2001.1008
File:
PDF, 111 KB
english, 2001
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