Solid-phase immune electron microscopy (SPIEM) for rapid...

Journal of Immunological Methods 1980 Vol. 38; Iss. 1-2

Solid-phase immune electron microscopy (SPIEM) for rapid viral diagnosis

David Katz, Yoheved Straussman, Abraham Shahar, Alexander Kohn
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Volume:
38
Year:
1980
Language:
english
DOI:
10.1016/0022-1759(80)90341-5
File:
PDF, 305 KB
english, 1980
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