Overlayer-substrate spacing for argon and krypton on graphite determined by leed intensity analysis
Christopher G. Shaw, S.C. Fain Jr., M.D. Chinn, M.F. ToneyVolume:
97
Year:
1980
Language:
english
DOI:
10.1016/0039-6028(80)90109-0
File:
PDF, 509 KB
english, 1980