![](/img/cover-not-exists.png)
Coexistence of non-registered monolayer and bilayer solid films: Statistical mechanics
L.W. Bruch, Mein Sieng WeiVolume:
100
Year:
1980
Language:
english
DOI:
10.1016/0039-6028(80)90417-3
File:
PDF, 1.53 MB
english, 1980