Studies of the composition, ion-induced reduction and preferential sputtering of anodic oxide films on Hg0.8Cd0.2Te by XPS
A.B. Christie, I. Sutherland, J.M. WallsVolume:
135
Year:
1983
Language:
english
DOI:
10.1016/0039-6028(83)90220-0
File:
PDF, 1.21 MB
english, 1983