Rapid estimation of chromosomal damage in yeast due to the...

Rapid estimation of chromosomal damage in yeast due to the effects of environmental chemicals using pulsed field gel electrophoresis

Joachim Ehlers, Martina Tosch, Ismail AlBaz, Ernst-Randolf Lochmann
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Volume:
22
Year:
1991
Language:
english
DOI:
10.1016/0147-6513(91)90053-r
File:
PDF, 356 KB
english, 1991
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