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Scheduling semiconductor test operations: Minimizing maximum lateness and number of tardy jobs on a single machine
Reha Uzsoy, Chung-Yee Lee, Louis A. Martin-VegaVolume:
39
Year:
1992
Language:
english
Pages:
20
DOI:
10.1002/1520-6750(199204)39:33.0.co;2-f
File:
PDF, 1.05 MB
english, 1992