The structural characterization of dc sputtered in situ...

Materials Letters 1990 Vol. 10; Iss. 3

The structural characterization of dc sputtered in situ YBa2Cu3O7−x thin films

M. Guilloux-Viry, M.G. Karkut, A. Perrin, M. Sergent
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Volume:
10
Year:
1990
Language:
english
DOI:
10.1016/0167-577x(90)90045-n
File:
PDF, 650 KB
english, 1990
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